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Professor Ralph James, President of SPIE visited SITP
ArticleSource: sitp
Update time: 2009-04-01 00:00:00
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At the invitation of DAI Ning, the deputy director of the Shanghai Institute of Technical Physics (SITP), Professor Ralph James, President of the International Society for Optical Engineering (SPIE) visited the institute recently.

During his visit, Professor Ralph James made an academic report entitled 'Cadmium Zinc Telluride X-ray and Gamma Detectors: Yesterday,Today and Tomorrow'and also described SPIE in brief. He encouraged more Chinese researchers to join SPIE and had a discussion with the researchers of the institute in related technology and further cooperation. Then, he visited the research achievement exhibition hall of the institute.

Professor Ralph James is a very accomplished specialist in the area of semiconductor detectors and has held the position of the head of the room temperature semiconductor detector branch of IEEE for nearly ten times.

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