James Torley, a professor from the University of Colorado at Boulder of USA, visited the Shanghai Insititute of Technical Physics (SITP) on January 20, 2011. Professor LU Wei, director of the Nation Laboratory for Infrared Physics, SITP, met James Torley and held a colloquium on infrared sensing with him. More than 30 researchers of the laboratory attended the colloquium.

Professor James Torley described the research progress made by the University of Colorado in the field of infrared sensing and discussed the topics of infrared focal plane devices and sensing technology with the researchers.

After the colloquium, James Torley visited the Nation Laboratory for Infrared Physics.